Temperature measurement from the Raman spectra of porous silicon

Wuli Xuebao/Acta Physica Sinica

Volumn 54, Issue 10, 2005, Pages 4654-4658

  Bai, Ying ^a   Lan, Yan Na ^a   Mo, Yu Jun ^a  

^a HENAN UNIVERSITY   (China)

Author keywords

Laser power; Porous silicon; Raman spectrum; Sample temperature

Indexed keywords

EID: 27544503228     PISSN: 10003290     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (11)