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Volumn 38, Issue 21, 2005, Pages 3953-3957

Investigation of compensation effect for isothermal crystallization in glassy Se80-xTe20Mx (M ≤ Cd, Ge, Sb) alloys

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; AMORPHOUS MATERIALS; CRYSTALLIZATION; DIELECTRIC RELAXATION; DIFFUSION IN SOLIDS; ELECTRIC CONDUCTIVITY; GLASS; ISOTHERMS;

EID: 27544482936     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/38/21/018     Document Type: Article
Times cited : (8)

References (35)
  • 29
    • 0035577260 scopus 로고    scopus 로고
    • Soltan A S 2001 Physica B 307 78
    • (2001) Physica , vol.307 , Issue.1-4 , pp. 78
    • Soltan, A.S.1
  • 35
    • 4243897509 scopus 로고    scopus 로고
    • Emin D 2000 Phys. Rev. B 61 14543
    • (2000) Phys. Rev. , vol.61 , Issue.21 , pp. 14543
    • Emin, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.