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Volumn 172, Issue 3, 2005, Pages 163-186
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Gauge action improvement and smearing
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Author keywords
[No Author keywords available]
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Indexed keywords
SIGNAL TO NOISE RATIO;
TOPOLOGY;
SIGNAL-TO-NOISE PREDICTION;
SMEARING;
WILSON LOOPS;
GAGES;
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EID: 27544434396
PISSN: 00104655
EISSN: None
Source Type: Journal
DOI: 10.1016/j.cpc.2005.06.011 Document Type: Article |
Times cited : (7)
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References (31)
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