Structural and luminescence properties of vapour-etched porous silicon and related compounds

Physica Status Solidi C: Conferences

Volumn 2, Issue 9, 2005, Pages 3409-3413

  Aouida, S ^a   Saadoun, M ^a   Ben Saad, K ^a   Bessais B ^a  

^a Institut National de Recherche Scientifique et Technique Tunis   (Tunisia)

Author keywords

[No Author keywords available]

Indexed keywords

ETCHING; FOURIER TRANSFORM INFRARED SPECTROSCOPY; LIGHT EMISSION; NANOSTRUCTURED MATERIALS; OXIDATION; PHOTOLUMINESCENCE; SILICA; SILICON COMPOUNDS;

POWDER-LIKE PHASE; STAIN ETCHING TECHNIQUES; VAPOUR ETCHING (VE) TECHNIQUE; VOLUME RATIO;

POROUS SILICON;

EID: 27344449281     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200561191     Document Type: Conference Paper

References (6)

1. M. Saadoun, N. Mliki, H. Kaabi, K. Daoudi, B. Bessaïs, H. Ezzaouia, R. Bennaceur, Thin Solid Films 405, 29 (2002).
2. M. Saadoun, B. Bessaïs, N. Mliki, M. Ferid, H. Ezzaouia, R. Bennaceur, Appl. Surf. Sci. 210, 240 (2003).
3. Lange's Handbook of Chemistry, 15th ed., edited by J.A. Dean (McGraw-Hill Publ., 1999).
4. S. Shih, K. H. Jung, T. Y. Hsieh, J. Sarathy, J.C. Campbell, D. L. Kwong, Appl. Phys. Lett. 60, 1863 (1992).
5. R. B. Heimann, M. B. Ives, N. S. McIntyre, Thin Solid Films 112, 329 (1984).
6. M. V. Wolkin, J. Jorne, P.M. Fauchet, G. Allan, C. Delerue, Phys. Rev. Lett. 82, 197 (1999).