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Applied Physics A: Materials Science and Processing

Volumn 81, Issue 8, 2005, Pages 1675-1679

Microstructure of YBCO thin film and its effect on superheating

(2) Cai, Y Q a Yao, X a

a SHANGHAI JIAO TONG UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; MICROSTRUCTURE; OPTICAL MICROSCOPY; SUPERHEATERS; THIN FILMS; X RAY DIFFRACTION;

FILM DEFECT STRUCTURE; HIGH-TEMPERATURE OPTICAL MICROSCOPY (HTOM); INTERFACE DEFECTS; INTERFACE-ENERGY THEORY;

YTTRIUM BARIUM COPPER OXIDES;

EID: 27344448607 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s00339-005-3293-2 Document Type: Review

Times cited : (11)

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