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Volumn 2, Issue 7, 2005, Pages 2732-2735

Influence of stacking faults on the properties of GaN-based UV light-emitting diodes grown on non-polar substrates

Author keywords

[No Author keywords available]

Indexed keywords

GALLIUM NITRIDE; LIGHT EMITTING DIODES; LUMINESCENCE; SAPPHIRE; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET RADIATION;

EID: 27344441813     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200461547     Document Type: Conference Paper
Times cited : (12)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.