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Volumn 987, Issue , 1995, Pages 171-188

Design error diagnosis in sequential circuits

Author keywords

[No Author keywords available]

Indexed keywords

SEQUENTIAL CIRCUITS; TIMING CIRCUITS;

EID: 27344435587     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/3-540-60385-9_11     Document Type: Conference Paper
Times cited : (20)

References (18)
  • 1
    • 0024931915 scopus 로고
    • Automating the Diagnosis and the Rectification of Design Errors with PRIAM
    • J. C. Madre, O. Coudert, J. P. Billon, "Automating the Diagnosis and the Rectification of Design Errors with PRIAM," Proceedings of ICCAD’89, pp. 30-33, 1989.
    • (1989) Proceedings of ICCAD’89 , pp. 30-33
    • Madre, J.C.1    Coudert, O.2    Billon, J.P.3
  • 3
    • 0026962074 scopus 로고
    • Locating Logic Design Errors via Test Generation and Don’t Care Propagation
    • S. Y. Kuo, "Locating Logic Design Errors via Test Generation and Don’t Care Propagation," Proceedings of EURO-DAC’92, pp. 466-471, 1992.
    • (1992) Proceedings of EURO-DAC’92 , pp. 466-471
    • Kuo, S.Y.1
  • 5
    • 77956047669 scopus 로고
    • Verification and Diagnosis of Digital Systems by Ternary Reasoning
    • Springer Verlag, May
    • A. M. Wahba, E. J. Aas, "Verification and Diagnosis of Digital Systems by Ternary Reasoning," Lecture Notes on Computer Science № 683, Springer Verlag, pp. 55-67, May 1993.
    • (1993) Lecture Notes on Computer Science , Issue.683 , pp. 55-67
    • Wahba, A.M.1    Aas, E.J.2
  • 6
    • 85001107733 scopus 로고
    • Logic Verification of Incomplete Functions and Design Error Location
    • Springer Verlag, May
    • Q. H. Zhang, C. Trullemans, "Logic Verification of Incomplete Functions and Design Error Location," Lecture Notes on Computer Science № 683, Springer Verlag, pp. 68-79, May 1993.
    • (1993) Lecture Notes on Computer Science , Issue.683 , pp. 68-79
    • Zhang, Q.H.1    Trullemans, C.2
  • 8
    • 84948172007 scopus 로고
    • Design Error Diagnosis in Logic Circuits using Diagnosis-Oriented Test Patterns
    • ARTEMIS-IMAG, Grenoble, France, June
    • A. Wahba, and D. Borrione, "Design Error Diagnosis in Logic Circuits using Diagnosis-Oriented Test Patterns," Research Report RR-940-I, ARTEMIS-IMAG, Grenoble, France, June 1994.
    • (1994) Research Report RR-940-I
    • Wahba, A.1    Borrione, D.2
  • 9
    • 84948168632 scopus 로고
    • Logic Verification and Design Error Diagnosis for Combinational Circuits
    • Université Catholique de Louvain, Belgium, Feb
    • Q. Zhang, "Logic Verification and Design Error Diagnosis for Combinational Circuits," Ph.D. Thesis, Université Catholique de Louvain, Belgium, Feb. 1995.
    • (1995) Ph.D. Thesis
    • Zhang, Q.1
  • 13
    • 0026982209 scopus 로고
    • Quantifying Design Quality: A Model and Design Experiments
    • IEEE Computer Society
    • E. J. Aas, K. A. Klingshheim, and T. Steen, "Quantifying Design Quality: A Model and Design Experiments," Proc. EURO-ASIC’92, IEEE Computer Society, pp. 172-177, 1992.
    • (1992) Proc. EURO-ASIC’92 , pp. 172-177
    • Aas, E.J.1    Klingshheim, K.A.2    Steen, T.3
  • 17
    • 0028720649 scopus 로고
    • Symbolic Exploration of Large Circuits with Enhanced Forward/Backward Traversal
    • Grenoble, France, Sept
    • G. Cabodi, P. Camurati, S. Quer, "Symbolic Exploration of Large Circuits with Enhanced Forward/Backward Traversal," Proceedings of EURO-DAC’94, pp. 22-27, Grenoble, France, Sept. 1994.
    • (1994) Proceedings of EURO-DAC’94 , pp. 22-27
    • Cabodi, G.1    Camurati, P.2    Quer, S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.