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Volumn 2, Issue 8, 2005, Pages 2962-2965

Raman scattering investigation on porous SiC layers

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; NANOSTRUCTURED MATERIALS; PHONONS; RAMAN SCATTERING; REACTIVE ION ETCHING; SCANNING ELECTRON MICROSCOPY;

CRYSTAL DISORDERING; PHONON-PLASMON COUPLING; RAMAN POLARIZABILITY TENSORS; SURFACE POLARITON;

POROUS SILICON;

EID: 27344434565 PISSN: 16101634 EISSN: None Source Type: Conference Proceeding
DOI: 10.1002/pssc.200460731 Document Type: Conference Paper

Times cited : (4)

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