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Volumn 72, Issue 2, 2005, Pages

Scaling in activated escape of underdamped systems

Author keywords

[No Author keywords available]

Indexed keywords

BIFURCATION POINT; CRITICAL EXPONENTS; NOISE-INDUCED ESCAPE;

EID: 27244447842     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.72.021102     Document Type: Article
Times cited : (31)

References (27)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.