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Volumn 15, Issue 10, 2005, Pages 618-620
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An AVM technique for 3-D TLM with symmetric condensed nodes
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Author keywords
Computer aided design (CAD); Electromagnetic modeling; Sensitivity analysis; Transmission line modeling (TLM)
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Indexed keywords
ELECTROMAGNETIC MODELING;
SCATTERING MATRIX;
SYMMETRIC CONDENSED NODES (SCN);
TRANSMISSION-LINE MODELING (TLM);
COMPUTER AIDED DESIGN;
DIELECTRIC MATERIALS;
ELECTROMAGNETIC WAVES;
FUNCTIONS;
MATHEMATICAL MODELS;
MATRIX ALGEBRA;
PROBLEM SOLVING;
SENSITIVITY ANALYSIS;
ELECTRIC LINES;
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EID: 27144558036
PISSN: 15311309
EISSN: None
Source Type: Journal
DOI: 10.1109/LMWC.2005.856696 Document Type: Article |
Times cited : (10)
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References (5)
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