Estimating the absolute quantum yield of sensitization for IR-sensitive photothermographic imaging materials

Journal of Imaging Science and Technology

Volumn 49, Issue 4, 2005, Pages 348-355

  Kong, Steven H ^a,b  

^a EASTMAN KODAK COMPANY   (United States)

^b IS and T ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING MATERIALS; PHOTOPHYSICS; QUANTUM YIELD; SENSITIZATION;

COMPUTER SIMULATION; MONTE CARLO METHODS; PHOTOGRAPHY; PHOTOSENSITIVITY; SENSITOMETERS; SILVER COMPOUNDS;

THERMOGRAPHY (IMAGING);

EID: 27144534892     PISSN: 10623701     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (10)

1. th ed, T. H. James, Ed. (Macmillian, New York, NY, 1977), p. 255.
2. S. H. Kong, J. Imaging Sci. Technol. ISSN: 1062-3701, 43, 509 (1999).
3. C. Zou, J. B. Phillip, S. M. Shor, M. C. Skinner, and P. Zhou, US Patent 5,434,043(1995).
4. J. R. Lenhard, B. R. Hein and A. A. Muenter, J. Phys. Chem. 97 (1993), p. 8269.
5. J. C. Dainty and R. Shaw, Image Science, (Academic Press, NY, 1974), chap. 3.
6. T. Ito, S. Nishiwaki and T. Mitsuhasi, J. Imaging Sci. Technol. ISSN: 1062-3701, 45, 357 (2001)
7. T. Ohzeki, IS&T/SPSTJ 2004 International Symposium on Silver Halide Technology, (IS&T, Springfield, VA, 2004), p. ???.
8. I. P. Kaminow, L. W. Stulz, E. A. Chandross, and C. A. Pryde, Appl. Opt. 11, 1563 (1972).
9. B. E. Bayer and J. F. Hamilton, J. Opt. Soc. Amer. 55, 439 (1965).
10. E. Fuchs, Photogr. Ind. 28, 1172 (1930).