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Volumn 26, Issue 10, 2005, Pages 731-733

High-performance hydrogenated amorphous-Si TFT for AMLCD and AMOLED applications

Author keywords

Hydrogenated amorphous silicon (a Si:H); Light shield; Parasitic resistance; Thin film transistor (TFT)

Indexed keywords

AMORPHOUS SILICON; CARRIER MOBILITY; ELECTRIC RESISTANCE; LEAKAGE CURRENTS; LIGHT EMITTING DIODES; LIQUID CRYSTAL DISPLAYS; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SEMICONDUCTOR DEVICE STRUCTURES;

EID: 27144518079     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2005.855405     Document Type: Article
Times cited : (51)

References (9)
  • 3
    • 0001646141 scopus 로고    scopus 로고
    • "Pursuit of active matrix organic light emitting diode displays"
    • R. M. A. Awson and M. G. Ane, "Pursuit of active matrix organic light emitting diode displays," in SID Tech. Dig., 2001, pp. 372-375.
    • (2001) SID Tech. Dig. , pp. 372-375
    • Awson, R.M.A.1    Ane, M.G.2
  • 4
    • 0012035151 scopus 로고    scopus 로고
    • "a-Si: FH TFT active-matrix phosphorescent OLED pixel"
    • J. A. Nichols, T. N. Jackson, M. H. Lu, and M. Hack, "a-Si:H TFT active-matrix phosphorescent OLED pixel," in SID Tech. Dig., 2002, pp. 1368-1370.
    • (2002) SID Tech. Dig. , pp. 1368-1370
    • Nichols, J.A.1    Jackson, T.N.2    Lu, M.H.3    Hack, M.4
  • 6
    • 0024177067 scopus 로고
    • "An a-Si TFT with a new light-shield structure and its application to active-matrix liquid crystal displays"
    • M. Akiyama, H. Toeda, H. Ohtaguro, K. Suzuki, and H. Ito, "An a-Si TFT with a new light-shield structure and its application to active-matrix liquid crystal displays," in IEDM Tech. Dig., 1988, pp. 268-271.
    • (1988) IEDM Tech. Dig. , pp. 268-271
    • Akiyama, M.1    Toeda, H.2    Ohtaguro, H.3    Suzuki, K.4    Ito, H.5
  • 9
    • 33645607953 scopus 로고
    • "An experimental study of the source/drain parasitic resistance effects in amorphous silicon thin film transistors"
    • Jul
    • S. Luana and G. W. Neudeck, "An experimental study of the source/ drain parasitic resistance effects in amorphous silicon thin film transistors," J. Appl. Phys., vol. 72, pp. 766-772, Jul. 1992.
    • (1992) J. Appl. Phys. , vol.72 , pp. 766-772
    • Luana, S.1    Neudeck, G.W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.