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Volumn 21, Issue 21, 2005, Pages 9537-9543

Parameters ruling capillary forces at the submillimetric scale

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; COMPUTER SIMULATION; GEOMETRY; LAPLACE TRANSFORMS; MATHEMATICAL MODELS; SURFACE TENSION;

EID: 27144495806     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0507131     Document Type: Article
Times cited : (44)

References (15)
  • 1
    • 0038801919 scopus 로고    scopus 로고
    • technical report; Institut de la matière condensé, Université de Lausanne: Lausanne, Switzerland
    • Capella, B.; Dietler, G. Force-Distance Curves by Atomic Force Microscopy, technical report; Institut de la matière condensé, Université de Lausanne: Lausanne, Switzerland, 1999.
    • (1999) Force-distance Curves by Atomic Force Microscopy
    • Capella, B.1    Dietler, G.2
  • 4
    • 27144469864 scopus 로고    scopus 로고
    • Proceedings of the International Semiconductor Device Research Symposium, ISDRS'99: Charlottesville, VA
    • Kim, C.-J. Mems Devices Based on the Use of Surface Tension; Proceedings of the International Semiconductor Device Research Symposium, ISDRS'99: Charlottesville, VA, 1999.
    • (1999) Mems Devices Based on the Use of Surface Tension
    • Kim, C.-J.1
  • 11
    • 0027627193 scopus 로고
    • Marmur, A. Langmuir 1993, 9, 1922-1926.
    • (1993) Langmuir , vol.9 , pp. 1922-1926
    • Marmur, A.1
  • 13
    • 27144554173 scopus 로고    scopus 로고
    • note
    • 11 uses the terms "capillary" force for the term arising from the pressure difference and "interfacial tension force" for that exerted by the surface tension.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.