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Volumn 14, Issue 4, 2005, Pages 806-811

Piezoresistive accelerometers for MCM-Package - Part II: The packaging

Author keywords

Multichip modules deposited (MCM D) package; Piezoresistive accelerometers; Smart microelectromechanical systems (MEMS)

Indexed keywords

ACCELEROMETERS; ELECTRONICS PACKAGING; FLIP CHIP DEVICES; INTELLIGENT MATERIALS; MULTICHIP MODULES; PIEZOELECTRIC DEVICES;

EID: 27144469579     PISSN: 10577157     EISSN: None     Source Type: Journal    
DOI: 10.1109/JMEMS.2005.845456     Document Type: Article
Times cited : (14)

References (8)
  • 1
    • 0012104584 scopus 로고    scopus 로고
    • "Multichip module packaging of microelectromechanical systems"
    • J. T. Butler, V. M. Bright, and J. H. Comtois, "Multichip module packaging of microelectromechanical systems," Sens. Actuators A, Phys., vol. 70, pp. 15-22, 1998.
    • (1998) Sens. Actuators A, Phys. , vol.70 , pp. 15-22
    • Butler, J.T.1    Bright, V.M.2    Comtois, J.H.3
  • 3
    • 0012104584 scopus 로고    scopus 로고
    • "Multichip module packaging of microelectromechanical systems"
    • J. T. Butler, V. M. Bright, and J. H. Comtois, "Multichip module packaging of microelectromechanical systems," Sens. Actuators A, Phys., vol. 70, pp. 15-22, 1998.
    • (1998) Sens. Actuators A, Phys. , vol.70 , pp. 15-22
    • Butler, J.T.1    Bright, V.M.2    Comtois, J.H.3
  • 7
    • 0038414268 scopus 로고    scopus 로고
    • "Interfacial delamination near solder bumps and UBM in flip-chip packages"
    • Y. Gu, T. Nakamura, W. Chen, and B. Cotterell, "Interfacial delamination near solder bumps and UBM in flip-chip packages," ASME J. Electron. Packag., vol. 123, pp. 295-301, 2001.
    • (2001) ASME J. Electron. Packag. , vol.123 , pp. 295-301
    • Gu, Y.1    Nakamura, T.2    Chen, W.3    Cotterell, B.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.