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Volumn 12, Issue 3-4, 2005, Pages 257-267

Spread spectrum sensors for critical fault location on live wire networks

Author keywords

Aging; Fault location; Health monitoring; Reflectometry; Spread spectrum; Wiring

Indexed keywords

AGING OF MATERIALS; ELECTRIC FAULT CURRENTS; ELECTRIC WIRING; INTERFERENCE SUPPRESSION; REFLECTOMETERS; SENSORS; SPREAD SPECTRUM COMMUNICATION;

EID: 27144458403     PISSN: 15452255     EISSN: None     Source Type: Journal    
DOI: 10.1002/stc.69     Document Type: Conference Paper
Times cited : (52)

References (19)
  • 1
    • 0035262867 scopus 로고    scopus 로고
    • Down to the wire: The hidden hazard of aging aircraft wiring
    • February
    • Furse CM, Haupt RL. Down to the wire: the hidden hazard of aging aircraft wiring. IEEE Spectrum, February 2001; 35-39.
    • (2001) IEEE Spectrum , pp. 35-39
    • Furse, C.M.1    Haupt, R.L.2
  • 3
    • 33845433448 scopus 로고    scopus 로고
    • Review of federal programs for wire system safety
    • November
    • NSTC, Review of Federal Programs for Wire System Safety, White House Report, November 2000.
    • (2000) White House Report
  • 4
    • 27144476521 scopus 로고    scopus 로고
    • Subcommittee on Oversight and Investigations, Hearing, September 15, 1999
    • Committee on Transportation and Infrastructure (CTI), 1999. Subcommittee on Oversight and Investigations, Hearing, September 15, 1999, Aircraft Electrical System Safety, http://www.house.gov/transportation/oversight/09-15- 99/09-15-99memo.html
    • (1999) Aircraft Electrical System Safety
  • 7
    • 27144546754 scopus 로고    scopus 로고
    • Non-intrusive impedance-based cable tester, US Patent 5,977,773, August 15
    • Medelius PJ, Simpson HJ. Non-intrusive impedance-based cable tester, US Patent 5,977,773, August 15, 1997.
    • (1997)
    • Medelius, P.J.1    Simpson, H.J.2
  • 8
    • 0038180835 scopus 로고    scopus 로고
    • Frequency domain reflectometer for on board testing of aging aircraft wiring
    • Furse CM, Chung YC, Dangol R et al. Frequency domain reflectometer for on board testing of aging aircraft wiring. IEEE Transactions EMC, 2003; 45(2):306-315.
    • (2003) IEEE Transactions EMC , vol.45 , Issue.2 , pp. 306-315
    • Furse, C.M.1    Chung, Y.C.2    Dangol, R.3
  • 9
    • 27144524976 scopus 로고    scopus 로고
    • Application of phase detection frequency domain reflectometry for locating faults in an F-18 flight control harness
    • Chung Y, Furse C, Pruitt J. Application of phase detection frequency domain reflectometry for locating faults in an F-18 flight control harness, IEEE Transaction EMC.
    • IEEE Transaction EMC
    • Chung, Y.1    Furse, C.2    Pruitt, J.3
  • 12
    • 27144559215 scopus 로고    scopus 로고
    • Fault location on aircraft wiring using spread spectrum time domain reflectometry
    • To be published in
    • Smith P, Furse C, Gunther J. Fault location on aircraft wiring using spread spectrum time domain reflectometry. To be published in IEEE Sensors Journal.
    • IEEE Sensors Journal
    • Smith, P.1    Furse, C.2    Gunther, J.3
  • 13
    • 27144516825 scopus 로고    scopus 로고
    • Feasibility of spread spectrum sensors for location of arcs on live wires
    • To be published in
    • Furse CM, Smith P, Safavi M, Lo C. Feasibility of spread spectrum sensors for location of arcs on live wires. To be published in IEEE Sensors Journal.
    • IEEE Sensors Journal
    • Furse, C.M.1    Smith, P.2    Safavi, M.3    Lo, C.4
  • 17
    • 0004160965 scopus 로고    scopus 로고
    • New York. 6th edn
    • ILC Data Device Corp, Mil-STD 1553 Designer's Guide. Pp. 11-28 to 11-48. New York. 6th edn, 1998.
    • (1998) Mil-STD 1553 Designer's Guide


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.