Strain profiling of fatigue crack overload effects using energy dispersive X-ray diffraction

International Journal of Fatigue

Volumn 27, Issue 10-12, 2005, Pages 1408-1419

  Croft, M ^a,b   Zhong, Z ^b   Jisrawi, N ^a   Zakharchenko, I ^a   Holtz, R L ^c   Skaritka, J ^b   Fast, T ^a   Sadananda, K ^c   Lakshmipathy, M ^d   Tsakalakos, T ^a  

^a RUTGERS UNIVERSITY   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c NAVAL RESEARCH LABORATORY   (United States)

^d ZYGO CORPORATION   (United States)

Author keywords

Fatigue; Overload; Strain; Synchrotron; X ray

Indexed keywords

STRAIN; STRESS INTENSITY FACTORS; SYNCHROTRONS; TENSILE STRESS; X RAY DIFFRACTION ANALYSIS;

OVERLOAD; STRAIN PROFILING;

CRACK PROPAGATION;

EID: 27144455353     PISSN: 01421123     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijfatigue.2005.06.022     Document Type: Conference Paper

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