-
1
-
-
0035920696
-
-
Zhao Y, Feng Y, Cheng C H, Zhou L, Wu Y, Machi T, Fudamoto Y, Koshizuka N and Murakami M 2001 Appl. Phys. Lett. 79 1154
-
(2001)
Appl. Phys. Lett.
, vol.79
, Issue.8
, pp. 1154
-
-
Zhao, Y.1
Feng, Y.2
Cheng, C.H.3
Zhou, L.4
Wu, Y.5
MacHi, T.6
Fudamoto, Y.7
Koshizuka, N.8
Murakami, M.9
-
2
-
-
79956027837
-
-
Wang J, Bugoslavsky Y, Berenov A, Cowey L, Caplin A D, Cohen L F, MacManus-Driscoll J L, Cooley L D, Song X and Larbalestier D C 2002 Appl. Phys. Lett. 81 2026
-
(2002)
Appl. Phys. Lett.
, vol.81
, Issue.11
, pp. 2026
-
-
Wang, J.1
Bugoslavsky, Y.2
Berenov, A.3
Cowey, L.4
Caplin, A.D.5
Cohen, L.F.6
MacManus-Driscoll, J.L.7
Cooley, L.D.8
Song, X.9
Larbalestier, D.C.10
-
3
-
-
79957961706
-
-
Dou S X, Soltanian S, Horvat J, Wang X L, Zhou S H, Ionescu M, Liu H K, Munroe P and Tomsic M 2002 Appl. Phys. Lett. 81 3419
-
(2002)
Appl. Phys. Lett.
, vol.81
, Issue.18
, pp. 3419
-
-
Dou, S.X.1
Soltanian, S.2
Horvat, J.3
Wang, X.L.4
Zhou, S.H.5
Ionescu, M.6
Liu, H.K.7
Munroe, P.8
Tomsic, M.9
-
4
-
-
4344603651
-
-
Wang X L, Soltanian S, James M, Qin M J, Horvat J, Yao Q W, Liu H K and Dou S X 2004 Physica C 408-410 63
-
(2004)
Physica
, vol.408-410
, pp. 63
-
-
Wang, X.L.1
Soltanian, S.2
James, M.3
Qin, M.J.4
Horvat, J.5
Yao, Q.W.6
Liu, H.K.7
Dou, S.X.8
-
5
-
-
6344255056
-
-
Berenov A, Serquis A, Liao X Z, Zhu Y T, Peterson D E, Bugoslavsky Y, Yates K A, Blamire M G, Cohen L F and MacManus-Driscoll J L 2004 Supercond. Sci. Technol. 17 1093
-
(2004)
Supercond. Sci. Technol.
, vol.17
, Issue.10
, pp. 1093
-
-
Berenov, A.1
Serquis, A.2
Liao, X.Z.3
Zhu, Y.T.4
Peterson, D.E.5
Bugoslavsky, Y.6
Yates, K.A.7
Blamire, M.G.8
Cohen, L.F.9
MacManus-Driscoll, J.L.10
-
7
-
-
11044227587
-
-
Dou S X, Braccini V, Soltanian S, Klie R, Zhu Y, Li S, Wang X L and Larbalestier D 2004 J. Appl. Phys. 96 7549
-
(2004)
J. Appl. Phys.
, vol.96
, Issue.12
, pp. 7549
-
-
Dou, S.X.1
Braccini, V.2
Soltanian, S.3
Klie, R.4
Zhu, Y.5
Li, S.6
Wang, X.L.7
Larbalestier, D.8
-
10
-
-
1342298913
-
X-ray diffraction broadening effects in materials characterisation
-
Kimmel G and Dayan D 1999 X-ray diffraction broadening effects in materials characterisation Defect and Microstructure Analysis by Diffraction ed R L Snyder, J Fiala and H J Bunge (Oxford: Oxford University Press) p 698
-
(1999)
Defect and Microstructure Analysis by Diffraction
, pp. 698
-
-
Kimmel, G.1
Dayan, D.2
-
14
-
-
4544335542
-
-
Zhou S H, Pan A V, Horvat J, Qin M J and Liu H K 2004 Supercond. Sci. Technol. 17 S528
-
(2004)
Supercond. Sci. Technol.
, vol.17
, Issue.9
, pp. 528
-
-
Zhou, S.H.1
Pan, A.V.2
Horvat, J.3
Qin, M.J.4
Liu, H.K.5
-
15
-
-
0037809374
-
-
Soltanian S, Horvat J, Wang X L, Munroe P and Dou S X 2003 Physica C 390 185
-
(2003)
Physica
, vol.390
, Issue.3
, pp. 185
-
-
Soltanian, S.1
Horvat, J.2
Wang, X.L.3
Munroe, P.4
Dou, S.X.5
|