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Volumn 26, Issue 19, 2005, Pages 1547-1551

Microfocus X-ray scattering scanning microscopy for polymer applications

c DESY (Germany)

Author keywords

Damage zone; Microfocus X ray scattering; Polyamides; SAXS; Voids

Indexed keywords

CRACKS; FRACTURE; MOLECULAR STRUCTURE; POLYAMIDES; SCANNING ELECTRON MICROSCOPY; SYNCHROTRON RADIATION; X RAY SCATTERING;

BULK STRUCTURES; FRACTURE PROPERTIES; MOLECULAR ARCHITECTURE; VISIBLE CRACKS;

POLYMERS;

EID: 26944503835 PISSN: 10221336 EISSN: None Source Type: Journal
DOI: 10.1002/marc.200500428 Document Type: Article

Times cited : (24)

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