Elastic backscattering spectroscopic microscopy

Optics Letters

Volumn 30, Issue 18, 2005, Pages 2445-2447

  Liu, Yang ^a   Li, Xu ^a   Kim, Young L ^a   Backman, Vadim ^a  

^a Northwestern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING SPECTRA; MICROSCOPIC IMAGES; RIPPLE STRUCTURES; SPECTROSCOPIC DATA;

ELASTICITY; LIGHT SCATTERING; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS;

BACKSCATTERING;

ARTICLE; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; FLUORESCENCE MICROSCOPY; IMAGE QUALITY; INSTRUMENTATION; METHODOLOGY; RADIATION SCATTERING; REFRACTOMETRY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; SPECTROFLUOROMETRY; SYSTEM ANALYSIS;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MICROSCOPY, FLUORESCENCE; PHANTOMS, IMAGING; REFRACTOMETRY; REPRODUCIBILITY OF RESULTS; SCATTERING, RADIATION; SENSITIVITY AND SPECIFICITY; SPECTROMETRY, FLUORESCENCE; SYSTEMS INTEGRATION;

EID: 26844563991     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.30.002445     Document Type: Article

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