Effect of stress on the dielectric constant of alumina

Journal of Electronic Packaging

Volumn 127, Issue 3, 2005, Pages 235-236

  Wen, Sihai ^a   Chung, D D L ^a  

^a UNIVERSITY AT BUFFALO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSIVE STRESS; ELECTRONICS PACKAGING; PERMITTIVITY; STRESS ANALYSIS;

MULTIPLICATIVE NOISE; RELATIVE DIELECTRIC;

ALUMINA;

EID: 26844549149     PISSN: 10437398     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.1939029     Document Type: Article

References (14)

1. Kulkarni, A. K., Upadhyaya, D. D., and Rao, S. V. K., 1982, "Studies on Development of Alumina Substrates," Transactions of the Indian Ceramic Society 41 (2), pp. 25-29.
2. Yatsuka, H., Ishizaki, M., Takano, T., and Komizo, H., 1980, "Millimeter-Wave IC Components Using Fine Grained Alumina Substrate," IEEE Mtt-S Int Microwave Symp Digest No. 80CH1545-3 MTT, pp. 276-278.
3. Frost, H. M., and Shalek, P. D., 1987, "High-Temperature Dielectric Measurements of High-Purity Alumina Ceramics," Conf. Digest - 12th Int. Conf. Infrared and Millimeter Waves, IEEE, New York, No. 87CH2490-1, pp. 228.
4. Ueyama, T., Wada, H., and Uehara, H., 1988, "Influence of Alumina Contents and Firing Temperature on the Electrical Properties of Alumina Substrates," J. Jpn. Soc. Powder Powder Metall. 35(8), pp. 793-798.
5. Varma, H. K., Mani, T. V., Warrier, K. G. K., Damodaran, A. D., and Balachandran, U., 1994, "Sintering of Thin Sheets of Alumina Prepared by the Sol-Spray Technique," J. Mater. Sci. Lett. 13(7), pp. 491-493.
6. Xia, F., and Yao, X., 2001, "Role of PbO Content on the Dielectric and Piezoelectric Properties of PZN-Based Ceramics," J. Mater. Sci. 36(1), pp. 247-253.
7. Hosono, Y., Harada, K., Yamashita, Y., Dong, M., and Ye, Z.-G., 2000, "Growth, Electric and Thermal Properties of Lead Scandium Niobate-Lead Magnesium Niobate-Lead Titanate Ternary Single Crystals," Jpn. J. Appl. Phys., Part 1 39(9), pp. 5589-5592.
8. 2O" Jpn. J. Appl. Phys., Part 1 39(9B), pp. 5552-5555.
9. 3 Ceramics," Ferroelectrics 242(1-4), pp. 13-24.
10. 2 Plus Substitution on Dielectric and Electric-Field-Induced Strain Properties of PMN-PZ-PT Ceramics," J. Am. Ceram. Soc. 83(11), pp. 2693-2698.
11. 3 Ceramics," J. Mater. Sci. Lett. 19(19), pp. 1705-1708.
12. Cho, Y. S., Pilgrim, S. M., Giesche, H., and Bridger, K., 2000, "Dielectric and Electromechanical Properties of Chemically Modified PMN-PT-BT Ceramics," J. Am. Ceram. Soc. 83(10), pp. 2473-2480.
13. Sundar, V., and Newnham, R. E., 1996, "Converse Method Measurements of Electrostriction Coefficients in Low-K Dielectrics," Mater. Res. Bull. 31(5), pp. 545-554.
14. Valbin, L., Sevely, L., and Spirkovitch, S., 2000, "Low Temperature Piezoelectric Aluminum Nitride Thin Film," Proc. SPIE-The Int. Society for Optical Engineering, Micromachining and Microfabrication Process Technology, SPIE, Bellingham, WA, Vol. 4174, pp. 154-163.