Instrument response measurements of ion mobility spectrometers in situ: Maintaining optimal system performance of fielded systems

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5795, Issue , 2005, Pages 54-64

  Wallis, Eric ^a,d   Griffin, Todd M ^b   Popkie Jr , Norm ^a   Eagan, Michael A ^a   McAtee, Robert F ^a   Vrazel, Danet ^c   McKinly, Jim ^c  

^a NAVAL SURFACE WARFARE CENTER   (United States)

^b General Dynamics ATP   (United States)

^c Kin Tek Laboratories Inc   (United States)

^d Bldg 3324 ^*  (United States)

Author keywords

Chemical Warfare Agent Detection; Ion Mobility Spectroscopy

Indexed keywords

CALIBRATION; COMPUTER SOFTWARE; EXPLOSIVES; MILITARY OPERATIONS; PREVENTIVE MAINTENANCE; SENSITIVITY ANALYSIS;

CHEMICAL WARFARE AGENT DETECTION; INSTRUMENT PERFORMANCE; ION MOBILITY SPECTROSCOPY; SOFTWARE INTERFACE;

OPTIMAL SYSTEMS;

EID: 26844545889     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.609920     Document Type: Conference Paper

References (6)

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3. McKinley, J; Majors, R.E.; LCGC; 2000, 18, 1024-1033.
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5. Spangler, G.E.; Carr, T.W.; Plasma Chromatography, Plenum, New York, 1984.
6. Spangler, G.E.; Carrico, J.P.; International Journal of Mass Spectrometry and Ion Physics, 1983, 52, 267.