Room-temperature Coulomb fingerprints in thin films of a Cu+SiO2 composite material

JETP Letters

Volumn 64, Issue 10, 1996, Pages 736-741

  Gurevich, S A ^a   Horenko, V V ^a   Zarayskaya, T A ^a   Kupriyanov, L Yu ^b   Kupriyanov, M Yu ^c   Vasilevskaya, T N ^d   Vyshenski, S V ^c,e  

^a IOFFE INSTITUTE   (Russian Federation)

^b KARPOV INSTITUTE OF PHYSICAL CHEMISTRY   (Russian Federation)

^c MOSCOW STATE UNIVERSITY   (Russian Federation)

^d GREBENSHCHIKOV INSTITUTE OF SILICATE CHEMISTRY   (Russian Federation)

^e TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 26844517559     PISSN: 00213640     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.567290     Document Type: Article

References (11)

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