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Volumn 60, Issue 9-10, 2005, Pages 1308-1315

An alternative approach to spectrum base line estimation

Author keywords

Continuum; Data processing; Robust fit; Spectrum analysis

Indexed keywords

ALGORITHMS; CODES (SYMBOLS); CONTINUUM MECHANICS; DATA PROCESSING; FUNCTIONS; SPECTRUM ANALYSIS; WEBSITES;

EID: 26844501257     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2005.06.006     Document Type: Article
Times cited : (28)

References (12)
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  • 4
    • 0042834107 scopus 로고    scopus 로고
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    • K.M. Gilbert, and B.M. Petrson An intrinsic Baldwin effect in the Hβ broad emission line in the spectra of NGC 5548 APJ 587 2003 123 127
    • (2003) APJ , vol.587 , pp. 123-127
    • Gilbert, K.M.1    Petrson, B.M.2
  • 5
    • 0001165960 scopus 로고
    • Power lows, flicker noise, and the Barkhausen effect
    • L.V. Meisel, and P.J. Cote Power lows, flicker noise, and the Barkhausen effect Phys. Rev., B 46 1992 10822 10828
    • (1992) Phys. Rev., B , vol.46 , pp. 10822-10828
    • Meisel, L.V.1    Cote, P.J.2
  • 6
    • 0000054421 scopus 로고    scopus 로고
    • Barkhausen noise: Elementary signals, power laws and scaling relations
    • D. Spasojević, S. Bukvić, S. Milošević, and E. Stanley Barkhausen noise: elementary signals, power laws and scaling relations Phys. Rev., E 54 1996 2531 2546
    • (1996) Phys. Rev., e , vol.54 , pp. 2531-2546
    • Spasojević, D.1    Bukvić, S.2    Milošević, S.3    Stanley, E.4
  • 7
    • 0042513605 scopus 로고    scopus 로고
    • L subshell fluorescence cross-sections and relative intensity ratios of some elements in the atomic range 72 ≤ Z ≤ 92
    • A. Gurol, and A. Karabulat L subshell fluorescence cross-sections and relative intensity ratios of some elements in the atomic range 72 ≤ Z ≤ 92 Spectrochim. Acta, Part B: Atom. Spectrosc. 58 2003 1445 1452
    • (2003) Spectrochim. Acta, Part B: Atom. Spectrosc. , vol.58 , pp. 1445-1452
    • Gurol, A.1    Karabulat, A.2
  • 8
    • 0043014595 scopus 로고    scopus 로고
    • Analysis of depth profile for impurity concentration in Si wafer by synchrotron radiation excited total reflection X-ray fluorescence spectroscopy
    • Byung-Kook Huh, Jae-Song Kim, Nam-Su Shin, Yang-Mo Koo, and Hye-Young Chung Analysis of depth profile for impurity concentration in Si wafer by synchrotron radiation excited total reflection X-ray fluorescence spectroscopy Spectrochim. Acta, Part B: Atom. Spectrosc. 58 2003 1445 1452
    • (2003) Spectrochim. Acta, Part B: Atom. Spectrosc. , vol.58 , pp. 1445-1452
    • Byung-Kook, H.1    Jae-Song, K.2    Nam-Su, S.3    Yang-Mo, K.4    Hye-Young, C.5
  • 10
    • 0034791543 scopus 로고    scopus 로고
    • Transition probabilities of several transitions in the Ar III and Ar IV spectra
    • S. Djeniže, and S. Bukvić Transition probabilities of several transitions in the Ar III and Ar IV spectra A&A 365 2001 252 257
    • (2001) A&A , vol.365 , pp. 252-257
    • Djeniže, S.1    Bukvić, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.