Shuttle TPS inspection using triangulation scanning technology

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5798, Issue , 2005, Pages 26-33

  Deslauriers, Adam ^a   Showalter, Ian ^a   Montpool, Andrew ^b   Taylor, Ross ^b   Christie, Lain ^a  

^a Neptec Design Group Ltd   (Canada)

^b Neptec International   (United States)

Author keywords

3D; Autosynchronous; Inspection; Scanner; Shuttle; Triangulation

Indexed keywords

3D; AUTOSYNCHRONOUS; SCANNERS; SHUTTLE;

DATA ACQUISITION; FLIGHT DYNAMICS; HEAT PROBLEMS; INSPECTION; SCANNING; SENSORS; SPACE RESEARCH; TRIANGULATION;

SPACE SHUTTLES;

EID: 26844498635     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.603692     Document Type: Conference Paper

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