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Volumn 3397, Issue , 2005, Pages 275-284

Timed I/O test sequences for discrete event model verification

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING; COMPUTER SIMULATION; GRAPH THEORY; SPECIFICATIONS;

EID: 26844477982     PISSN: 03029743     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1007/978-3-540-30583-5_30     Document Type: Conference Paper
Times cited : (12)

References (7)
  • 2
    • 0023963367 scopus 로고
    • DEVS formalism: A framework for hierarchical model development
    • Feb.
    • Concepcion, and B. P. Zeigler, "DEVS formalism: a framework for hierarchical model development," IEEE Trans. Software Eng., vol. 14, no. 2, pp. 228-241, Feb. 1988.
    • (1988) IEEE Trans. Software Eng. , vol.14 , Issue.2 , pp. 228-241
    • Concepcion1    Zeigler, B.P.2
  • 4
    • 0025474139 scopus 로고
    • Formal nethods for generating protocol conformance test sequences
    • Aug.
    • A. T. Dahbura, K. K. Sabnani, and M. Ümit Uyar, "Formal nethods for generating protocol conformance test sequences," Proc. of the IEEE, vol. 78, pp. 1317-1325, Aug. 1990.
    • (1990) Proc. of the IEEE , vol.78 , pp. 1317-1325
    • Dahbura, A.T.1    Sabnani, K.K.2    Ümit Uyar, M.3
  • 5
    • 0030212784 scopus 로고    scopus 로고
    • Principles and methods of testing finite state machines-A survey
    • Aug.
    • D. Lee, and M. Yannakakis, "Principles and methods of testing finite state machines-A survey," Proc of the IEEE, vol. 84, pp. 1090-1123, Aug. 1996.
    • (1996) Proc of the IEEE , vol.84 , pp. 1090-1123
    • Lee, D.1    Yannakakis, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.