메뉴 건너뛰기




Volumn 5789, Issue , 2005, Pages 80-83

First MMW characterization of ErAs/InAlGaAs/InP Semimetal-Semiconductor- Schottky diode (S 3) detectors for passive millimeter-wave and infrared imaging

Author keywords

Low noise operation; Millimeter wave imaging; Responsivity; Schottky diodes; Semimetal; Zero bias detectors

Indexed keywords

LOW NOISE OPERATION; MILLIMETER-WAVE IMAGING; RESPONSIVITY; SCHOTTKY DIODES; ZERO BIAS DETECTORS;

EID: 26844467303     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.604118     Document Type: Conference Paper
Times cited : (9)

References (4)
  • 1
    • 26244462150 scopus 로고    scopus 로고
    • Precision engineered semimetal-semiconductor diodes for mm-wave and THz rectifiers
    • Conference Digest [Late News Papers volume included], 21-23 June
    • Precision engineered semimetal-semiconductor diodes for mm-wave and THz rectifiers Zimmerman, J.; Brown, E.; Gossard, A.; Device Research Conference, 2004. 62nd DRC. Conference Digest [Late News Papers volume included], 21-23 June 2004, Pages:6 - 7 vol.2
    • (2004) Device Research Conference, 2004. 62nd DRC , vol.2 , pp. 6-7
    • Zimmerman, J.1    Brown, E.2    Gossard, A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.