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Volumn 5789, Issue , 2005, Pages 80-83
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First MMW characterization of ErAs/InAlGaAs/InP Semimetal-Semiconductor- Schottky diode (S 3) detectors for passive millimeter-wave and infrared imaging
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Author keywords
Low noise operation; Millimeter wave imaging; Responsivity; Schottky diodes; Semimetal; Zero bias detectors
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Indexed keywords
LOW NOISE OPERATION;
MILLIMETER-WAVE IMAGING;
RESPONSIVITY;
SCHOTTKY DIODES;
ZERO BIAS DETECTORS;
CAPACITANCE;
CRYSTAL LATTICES;
CRYSTALLOGRAPHY;
EQUIVALENT CIRCUITS;
INFRARED RADIATION;
METALLOIDS;
MICROWAVES;
MOLECULAR BEAM EPITAXY;
PHOTODETECTORS;
SCHOTTKY BARRIER DIODES;
SEMICONDUCTING INDIUM COMPOUNDS;
SEMICONDUCTOR DOPING;
IMAGING TECHNIQUES;
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EID: 26844467303
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.604118 Document Type: Conference Paper |
Times cited : (9)
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References (4)
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