Model diagnostic plots for repeated measures data

Biometrical Journal

Volumn 46, Issue 4, 2004, Pages 441-452

  Park, Taesung ^a   Lee, Seung Yeoun ^b  

^a Seoul National University   (South Korea)

^b Sejong University   (South Korea)

Author keywords

Multivariate linear models; Outliers; Q Q plot; Residuals

Indexed keywords

REGRESSION ANALYSIS;

MEASURE DATA; MODEL DIAGNOSTICS; MULTIVARIATE LINEAR MODEL; MULTIVARIATE REGRESSION MODELS; OUTLIER; QUANTILE-QUANTILE PLOT; REPEATED MEASUREMENTS; REPEATED MEASURES; RESIDUAL; UNIVARIATE;

NORMAL DISTRIBUTION;

EID: 26844439179     PISSN: 03233847     EISSN: None     Source Type: Journal    
DOI: 10.1002/bimj.200210044     Document Type: Review

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