TXRF spectrometry in conditions of the X-ray exciting beam formation by planar waveguide-resonator

Poverkhnost Rentgenovskie Sinkhronnye i Nejtronnye Issledovaniya

Volumn , Issue 7, 2005, Pages 5-12

  Egorov, V K ^a   Egorov, E V ^b  

^a RUSSIAN ACADEMY OF SCIENCES   (Russian Federation)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

RESONATORS; SURFACE PROPERTIES; WAVEGUIDES; X RAY SPECTROMETERS; X RAYS;

TXRF SPECTROMETRY; WAVEGUIDE-RESONATORS; X RAY BEAMS; X RAY SPECTROMETRY;

X RAY SPECTROSCOPY;

EID: 26844436206     PISSN: 02073528     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (16)