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Volumn 76-77, Issue , 2001, Pages 63-66
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Materials compatibility and organic Build-Up during Ozone-Based cleaning of semiconductor devices
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Author keywords
Carboxylic acids; Ion Chromatography; Organic; Ozone; Semiconductor cleaning
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Indexed keywords
CARBOXYLIC ACIDS;
CHEMICAL REACTIONS;
DEIONIZED WATER;
ION CHROMATOGRAPHY;
IONS;
OZONE;
PHASE INTERFACES;
SEMICONDUCTOR DEVICES;
SULFUR COMPOUNDS;
CHEMICAL COMPOSITIONS;
GAS-PHASE REACTIONS;
ORGANIC;
OXALATE IONS;
OZONE GENERATOR;
REACTION VESSEL;
SEMI-CONDUCTOR CLEANING;
TEFLON TUBING;
ORGANIC SEMICONDUCTOR MATERIALS;
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EID: 26644473252
PISSN: 10120394
EISSN: 16629779
Source Type: Book Series
DOI: 10.4028/www.scientific.net/SSP.76-77.63 Document Type: Conference Paper |
Times cited : (4)
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References (4)
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