TEM in-situ observation of SiO2 Doped TZP at High Temperatures

Materials Science Forum

Volumn 304-306, Issue , 1999, Pages 525-530

  Ikuhara, Y ^a   Nagai, Y ^a   Yamamoto, T ^a   Sakuma, T ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

Electron energy loss spectroscopy (eels); Grain boundary; High resolution electron microscopy (hrem); Segregation; Tem in situ observation

Indexed keywords

EID: 26544443685     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: None     Document Type: Article

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