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Volumn 3546, Issue , 2005, Pages 850-859
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Classification enhancement via biometric pattern perturbation
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Author keywords
[No Author keywords available]
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Indexed keywords
ALGORITHMS;
IMAGE ANALYSIS;
MEASUREMENT THEORY;
PATTERN RECOGNITION;
WAVELET TRANSFORMS;
CLASSIFICATION ALGORITHM;
FACE IMAGES;
REAL DATA;
BIOTECHNOLOGY;
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EID: 26444610009
PISSN: 03029743
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1007/11527923_89 Document Type: Conference Paper |
Times cited : (10)
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References (9)
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