The compositional dependence of the structural and optical properties of amorphous As20Se80-xTlx films

Physica B: Condensed Matter

Volumn 368, Issue 1-4, 2005, Pages 179-187

  El Nahass, M M ^a   Dongol, M ^b   Abou Zied, M ^b   El Denglawey, A ^b  

^a Ain Shams University   (Egypt)

^b SOUTH VALLEY UNIVERSITY   (Egypt)

Author keywords

Chalcogenide glasses; Electron microscopy; Optical properties; X ray diffraction

Indexed keywords

COMPOSITION; ELECTRON MICROSCOPES; OPTICAL PROPERTIES; PERMITTIVITY; THIN FILMS; X RAY DIFFRACTION;

CHALCOGENIDE GLASSES; GLASS SUBSTRATES; THERMAL EVAPORATION;

ARSENIC;

EID: 26444587201     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2005.07.014     Document Type: Article

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