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Volumn 63, Issue 5-6 SPEC. ISS., 2005, Pages 715-722
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Application of X-ray fluorescence for the analysis of some technological materials
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Author keywords
Alloy waste; Si(Li) detector; Standardless fundamental parameter mode; X ray fluorescence (XRF) technique
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Indexed keywords
ACTIVATION ANALYSIS;
COMPOSITION;
NEUTRONS;
RADIATION DETECTORS;
SILICON COMPOUNDS;
X RAY ANALYSIS;
ALLOW WASTE;
SI(LI) DETECTOR;
STANDARDLESS FUNDAMENTAL PARAMETER MODE;
X-RAY FLUORESCENCE (XRF) TECHNIQUE;
FLUORESCENCE;
COPPER;
GOLD;
HEAVY METAL;
PALLADIUM;
SILVER;
ABSORPTION SPECTROSCOPY;
ANALYTIC METHOD;
CHEMICAL COMPOSITION;
CHEMICAL STRUCTURE;
CONFERENCE PAPER;
MEASUREMENT;
NEUTRON ACTIVATION ANALYSIS;
PRIORITY JOURNAL;
QUANTITATIVE ANALYSIS;
STRUCTURE ANALYSIS;
X RAY FLUORESCENCE;
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EID: 26444586163
PISSN: 09698043
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apradiso.2005.05.034 Document Type: Conference Paper |
Times cited : (9)
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References (4)
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