Fractal dimension analysis and statistical processing of paper surface images towards surface roughness measurement

Lecture Notes in Computer Science

Volumn 3540, Issue , 2005, Pages 1218-1227

  Kuparinen, Toni ^a   Rodionov, Oleg ^a   Toivanen, Pekka ^a   Mielikainen, Jarno ^a   Bochko, Vladimir ^a   Korkalainen, Ate ^a   Parviainen, Juha ^a   Vartiainen, Erik ^a  

^a LAPPEENRANTA UNIVERSITY OF TECHNOLOGY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; FRACTALS; OPTICAL MICROSCOPY; PROFILOMETRY; STATISTICAL METHODS; SURFACE ROUGHNESS;

BRIGHTNESS MEASURES; FRACTAL DIMENSION ANALYSIS; ON-LINE CONTROL PURPOSES METHODS; OPTICAL PAPER;

IMAGE PROCESSING;

EID: 26444578222     PISSN: 03029743     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1007/11499145_123     Document Type: Conference Paper

References (19)

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