A catalogue of three-level regular fractional factorial designs

Metrika

Volumn 62, Issue 2-3, 2005, Pages 259-281

  Xu, Hongquan ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Clear effect; Linear code; Minimum aberration; Moment aberration; Resolution

Indexed keywords

EID: 26444570265     PISSN: 00261335     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00184-005-0408-x     Document Type: Conference Paper

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