|
Volumn 552, Issue 1-2, 2005, Pages 118-123
|
Erratum to: "Charge collection properties of X-ray irradiated monolithic active pixel sensors". [Nucl. Instr. and Meth. A 552 (2005) 118-123] (DOI:10.1016/j.nima.2005.06.020);Charge collection properties of X-ray irradiated monolithic active pixel sensors
|
Author keywords
CMOS; Monolithic active pixel sensors; Pixel detectors; Radiation hardness; Solid state detectors; Tracking
|
Indexed keywords
CHARGED PARTICLES;
CMOS INTEGRATED CIRCUITS;
DOSIMETRY;
HIGH ENERGY PHYSICS;
IONIZATION;
MEDICAL APPLICATIONS;
NUCLEAR PHYSICS;
RADIATION HARDENING;
CMOS;
GRANULAR DOSIMETRY;
MONOLITHIC ACTIVE PIXEL SENSORS (MAPS);
PIXEL DETECTORS;
RADIATION HARDNESS;
SOLID STATE DETECTORS;
TRACKING;
SENSORS;
|
EID: 26444554938
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2006.06.047 Document Type: Erratum |
Times cited : (11)
|
References (4)
|