Low-temperature firing and microwave dielectric properties of ZnO-Nb 2O5-TiO2-SnO2 ceramics with CuO-V2O5

Materials Research Bulletin

Volumn 40, Issue 11, 2005, Pages 1891-1898

  Zhang, Qi Long ^a   Yang, Hui ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

A. Ceramics; B. Electronic materials; C. X ray diffraction; D. Dielectric properties

Indexed keywords

CERAMIC MATERIALS; DIELECTRIC PROPERTIES; FIRING (OF MATERIALS); NIOBIUM COMPOUNDS; SINTERING; THERMAL EFFECTS; TIN COMPOUNDS; TITANIUM OXIDES; X RAY DIFFRACTION ANALYSIS;

ELECTRONIC MATERIALS; LOW-TEMPERATURE FIRING; MICROWAVE DIELECTRIC PROPERTIES;

ZINC OXIDE;

EID: 26444543808     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2005.06.009     Document Type: Article

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