Extended depth-of-field iris recognition system for a workstation environment

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5779, Issue , 2005, Pages 41-50

  Narayanswamy, Ramkumar ^a   Silveira, Paulo E X ^a   Setty, Harsha ^b   Pauca, V Paul ^b   Van Der Gracht, Joe ^c  

^a CDM Optics Inc   (United States)

^b WAKE FOREST UNIVERSITY   (United States)

^c HoloSpex Inc   (United States)

Author keywords

Biometric; Computational imaging; Depth of field; Imaging; Iris recognition; Optics

Indexed keywords

BIOMETRIC; COMPUTATIONAL IMAGING; DEPTH-OF-FIELD; IRIS RECOGNITION;

COMPUTATIONAL METHODS; DATABASE SYSTEMS; IDENTIFICATION (CONTROL SYSTEMS); IMAGING SYSTEMS; OPTICS; SECURITY OF DATA; SIGNAL TO NOISE RATIO;

PATTERN RECOGNITION;

EID: 26444532328     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.603612     Document Type: Conference Paper

References (9)

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