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Volumn 44, Issue 2, 1997, Pages 165-172

Ballistic Electron Emission Microscopy (BEEM) and spectroscopy of buried semiconductor heterostructures and quantum dots

Author keywords

Ballistic electron emission microscopy; Band offset; GaAs; GaN; GaSb; InAs; Quantum dots; Semiconductor heterostructure

Indexed keywords


EID: 26444529639     PISSN: 00408808     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (3)

References (28)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.