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Volumn 3546, Issue , 2005, Pages 191-200

A graph matching based approach to fingerprint classification using directional variance

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CLASSIFICATION (OF INFORMATION); DATABASE SYSTEMS; GRAPH THEORY; PROBLEM SOLVING;

EID: 26444528908     PISSN: 03029743     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1007/11527923_20     Document Type: Conference Paper
Times cited : (57)

References (20)
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    • Marcialis, G., Roli, F., Serrau, A.: Fusion of statistical and structural fingerprint classifiers. In Kittler, J., Nixon, M., eds.: 4th Int. Conf. Audio- and Video-Based Biometric Person Authentication. LNCS 2688 (2003) 310-317
    • (2003) LNCS , vol.2688 , pp. 310-317
    • Marcialis, G.1    Roli, F.2    Serrau, A.3
  • 6
    • 0036487278 scopus 로고    scopus 로고
    • Combining flat and structured representations for fingerprint classification with recursive neural networks and support vector machines
    • Yao, Y., Marcialis, G., Pontil, M., Frasconi, P., Roli, F.: Combining flat and structured representations for fingerprint classification with recursive neural networks and support vector machines. Pattern Recognition 36 (2003) 397-406
    • (2003) Pattern Recognition , vol.36 , pp. 397-406
    • Yao, Y.1    Marcialis, G.2    Pontil, M.3    Frasconi, P.4    Roli, F.5
  • 7
    • 0030104477 scopus 로고    scopus 로고
    • Fingerprint classification
    • Karu, K., Jain, A.: Fingerprint classification. Pattern Recognition 29 (1996) 389-404
    • (1996) Pattern Recognition , vol.29 , pp. 389-404
    • Karu, K.1    Jain, A.2
  • 8
    • 0021120530 scopus 로고
    • Fingerprint pattern classification
    • Kawagoe, M., Tojo, A.: Fingerprint pattern classification. Pattern Recognition 17 (1984) 295-303
    • (1984) Pattern Recognition , vol.17 , pp. 295-303
    • Kawagoe, M.1    Tojo, A.2
  • 10
    • 0023171692 scopus 로고
    • Optimal orientation detection of linear symmetry
    • IEEE Computer Society Press
    • Bigun, J., Granlund, G.: Optimal orientation detection of linear symmetry. In: Proc. 1st Int. Conf. on Computer Vision, IEEE Computer Society Press (1987) 433-438
    • (1987) Proc. 1st Int. Conf. on Computer Vision , pp. 433-438
    • Bigun, J.1    Granlund, G.2
  • 12
    • 0020752197 scopus 로고
    • A distance measure between attributed relational graphs for pattern recognition
    • Sanfeliu, A., Fu, K.: A distance measure between attributed relational graphs for pattern recognition. IEEE Transactions on Systems, Man, and Cybernetics 13 (1983) 353-363
    • (1983) IEEE Transactions on Systems, Man, and Cybernetics , vol.13 , pp. 353-363
    • Sanfeliu, A.1    Fu, K.2
  • 13
    • 0021022807 scopus 로고
    • Inexact graph matching for structural pattern recognition
    • Bunke, H., Allermann, G.: Inexact graph matching for structural pattern recognition. Pattern Recognition Letters 1 (1983) 245-253
    • (1983) Pattern Recognition Letters , vol.1 , pp. 245-253
    • Bunke, H.1    Allermann, G.2
  • 14
    • 24644458373 scopus 로고    scopus 로고
    • An error-tolerant approximate matching algorithm for attributed planar graphs and its application to fingerprint classification
    • Fred, A., Caelli, T., Duin, R., Campilho, A., de Ridder, D., eds.: Proc. 10th Int. Workshop on Structural and Syntactic Pattern Recognition
    • Neuhaus, M., Bunke, H.: An error-tolerant approximate matching algorithm for attributed planar graphs and its application to fingerprint classification. In Fred, A., Caelli, T., Duin, R., Campilho, A., de Ridder, D., eds.: Proc. 10th Int. Workshop on Structural and Syntactic Pattern Recognition. LNCS 3138 (2004) 180-189
    • (2004) LNCS , vol.3138 , pp. 180-189
    • Neuhaus, M.1    Bunke, H.2
  • 15
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    • A novel single-pass thinning algorithm and an effective set of performance criteria
    • Zhou, R., Quek, C., Ng, G.: A novel single-pass thinning algorithm and an effective set of performance criteria. Pattern Recognition Letters 16 (1995) 1267-1275
    • (1995) Pattern Recognition Letters , vol.16 , pp. 1267-1275
    • Zhou, R.1    Quek, C.2    Ng, G.3
  • 20
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    • A probabilistic approach to learning costs for graph edit distance
    • Kittler, J., Petrou, M., Nixon, M., eds.
    • Neuhaus, M., Bunke, H.: A probabilistic approach to learning costs for graph edit distance. In Kittler, J., Petrou, M., Nixon, M., eds.: Proc. 17th Int. Conference on Pattern Recognition. Volume 3. (2004) 389-393
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.