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Volumn 3540, Issue , 2005, Pages 224-234

A new method for affine registration of images and point sets

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTATIONAL COMPLEXITY; CONSTRAINT THEORY; EMBEDDED SYSTEMS; ITERATIVE METHODS; MATHEMATICAL TRANSFORMATIONS; PATTERN RECOGNITION; ROBUSTNESS (CONTROL SYSTEMS);

EID: 26444492584     PISSN: 03029743     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1007/11499145_25     Document Type: Conference Paper
Times cited : (12)

References (9)
  • 1
    • 0043237770 scopus 로고    scopus 로고
    • Image registration methods: A survey
    • Zitová, B., Flusser, J.: Image registration methods: a survey. Image Vis. Comput. 21 (2003) 977-1000
    • (2003) Image Vis. Comput. , vol.21 , pp. 977-1000
    • Zitová, B.1    Flusser, J.2
  • 4
    • 0033252387 scopus 로고    scopus 로고
    • Rigid point feature registration using mutual information
    • Rangarajan, A., Chui, H., Duncan, J.S.: Rigid point feature registration using mutual information. Medical Image Analysis 3 (1999) 425-440
    • (1999) Medical Image Analysis , vol.3 , pp. 425-440
    • Rangarajan, A.1    Chui, H.2    Duncan, J.S.3
  • 5
    • 0032645095 scopus 로고    scopus 로고
    • Cross-weighted moments and affine invariants for image registration and matching
    • Yang, Z., Cohen, F.: Cross-weighted moments and affine invariants for image registration and matching. IEEE Trans. Pattern Anal. Mach. Intell. 21 (1999) 804-814
    • (1999) IEEE Trans. Pattern Anal. Mach. Intell. , vol.21 , pp. 804-814
    • Yang, Z.1    Cohen, F.2
  • 6
    • 3042599593 scopus 로고    scopus 로고
    • Pattern matching with affine moment descriptors
    • Heikkilä, J.: Pattern matching with affine moment descriptors. Pattern Recognition 37 (2004) 1825-1834
    • (2004) Pattern Recognition , vol.37 , pp. 1825-1834
    • Heikkilä, J.1
  • 9
    • 0026137964 scopus 로고
    • Least-squares estimation of transformation parameters between two point patterns
    • Umeyama, S.: Least-squares estimation of transformation parameters between two point patterns. IEEE Trans. Pattern Anal. Mach. Intell. 13 (1991) 376-380
    • (1991) IEEE Trans. Pattern Anal. Mach. Intell. , vol.13 , pp. 376-380
    • Umeyama, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.