System analysis in vision

Eye

Volumn 12, Issue 1, 1998, Pages 85-101

  Van Der Tweel, L Henk ^c   Reits, Dik ^a   Spekreijse, H ^b  

^a NETHERLANDS INSTITUTE FOR NEUROSCIENCE   (Netherlands)

^b ACADEMIC MEDICAL CENTER   (Netherlands)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROENCEPHALOGRAM; ELECTRORETINOGRAM; MODEL; NONLINEAR SYSTEM; REVIEW; SYSTEM ANALYSIS; VISION;

EID: 2642703418     PISSN: 0950222X     EISSN: None     Source Type: Journal    
DOI: 10.1038/eye.1998.15     Document Type: Review

References (40)

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