SPM fabrication of nanometerscale ferromagnetic metal-oxide devices

Journal of Magnetism and Magnetic Materials

Volumn 272-276, Issue , 2004, Pages 1581-1583

  Shirakashi, Jun Ichi ^a   Takemura, Yasushi ^b  

^a AKITA PREFECTURAL UNIVERSITY   (Japan)

^b YOKOHAMA NATIONAL UNIVERSITY   (Japan)

Author keywords

Ferromagnetic tunnel junction; Scanning probe microscope (SPM); SPM oxidation

Indexed keywords

ATOMIC FORCE MICROSCOPY; LITHOGRAPHY; MOS DEVICES; NANOSTRUCTURED MATERIALS; NICKEL; OXIDATION; SCANNING; THIN FILMS; TUNNEL JUNCTIONS; VOLTAGE MEASUREMENT;

FERROMAGNETIC TUNNEL JUNCTIONS; SCANNING PROBE MICROSCOPE (SPM); SPM OXIDATION;

FERROMAGNETIC MATERIALS;

EID: 2642587484     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2003.12.308     Document Type: Article

References (9)

1. Dagata J.A., et al. Appl. Phys. Lett. 56:1990;2001.
2. Sugimura H., et al. Jpn. J. Appl. Phys. 32:1993;L553.
3. Shirakashi J., et al. Jpn. J. Appl. Phys. 35:1996;L1524.
4. Shirakashi J., et al. Jpn. J. Appl. Phys. 36:1997;L1120.
5. Shirakashi J., et al. Jpn. J. Appl. Phys. 36:1997;L1257.
6. Takemura Y., et al. Jpn. J. Appl. Phys. 39:2000;L1292.
7. Ono K., et al. J. Phys. Soc. Jpn. 66:1997;1261.
8. Shimada H., et al. J. Phys. Soc. Jpn. 67:1998;1359.
9. Yakushiji K., et al. J. Appl. Phys. 91:2002;7038.