Structural characterization of epitaxial Fe/Cr multilayers using anomalous X-ray and neutron reflectivity

Journal of Magnetism and Magnetic Materials

Volumn 272-276, Issue , 2004, Pages 1219-1220

  Gupta, A ^a   Paul, A ^a   Gupta, M ^a   Meneghini, C ^b   Pietsch, U ^c   Mibu, K ^d   Maddalena, A ^e   Dal Toe S ^e   Principi, G ^e  

^a Inter University Consortium for DAEF   (India)

^b ROMA TRE UNIVERSITY   (Italy)

^c UNIVERSITY OF POTSDAM   (Germany)

^d KYOTO UNIVERSITY   (Japan)

^e UNIVERSITY OF PADOVA   (Italy)

Author keywords

GMR; Interface roughness; Magnetic multilayer; Magnetic roughness; Reflectivity

Indexed keywords

ABSORPTION; ALGORITHMS; CORRELATION METHODS; DEPOSITION; DIFFUSION; MAGNETIC PROPERTIES; MAGNETIC THIN FILMS; MULTILAYERS; NEUTRON REFLECTION; POLARIZATION; SENSITIVITY ANALYSIS; SURFACE ROUGHNESS; X RAYS;

INTERFACE ROUGHNESS; MAGNETIC MULTILAYER; MAGNETIC ROUGHNESS; X-RAY REFLECTIVITY;

MAGNETIC MATERIALS;

EID: 2642584209     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2003.12.058     Document Type: Article

References (8)

1. Heinrich B., et al. J. Appl. Phys. 79:1996;4518.
2. Gupta A., Paul A. J. Phys. Soc. Japan. 69:2000;2182.
3. Kubik M., et al. Vacuum. 63:2001;337 Shinjo T., Keune W. J. Magn. Magn. Mater. 200:1999;598.
4. Kubik M., et al. Vacuum. 63:2001;337 Shinjo T., Keune W. J. Magn. Magn. Mater. 200:1999;598.
5. Uzdin V., Keune W., Walterfang M. J. Magn. Magn. Mater. 240:2002;504.
6. Schmidt C.M., et al. J. Appl. Phys. 89:2001;181.
7. Suresh N., et al. J. Appl. Phys. 87:2000;1.
8. Nelson C.S., et al. Phys. Rev. B. 60:1999;12234.