PIXE and ToF-SIMS analysis of streaker samplers filters

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 222, Issue 1-2, 2004, Pages 261-269

  D'Alessandro, A ^a   Nava, S ^a   Van Ham, R ^b   Adriaens, A ^c   Lucarelli, F ^d   Marcazzan, G ^e   Prati, P ^a   Valli, G ^e   Vecchi, R ^e   Zucchiatti, A ^a  

^a UNIVERSITY OF GENOA   (Italy)

^b UNIVERSITY OF ANTWERP   (Belgium)

^c GHENT UNIVERSITY   (Belgium)

^d UNIVERSITY OF FLORENCE   (Italy)

^e UNIVERSITY OF MILAN   (Italy)

Author keywords

Particulate matter; PIXE; Streaker sampler; ToF SIMS; Urban pollution

Indexed keywords

ATMOSPHERIC AEROSOLS; GAMMA RAYS; ION BEAMS; POLLUTION CONTROL; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SECONDARY ION MASS SPECTROMETRY; X RAY ANALYSIS;

PARTICLE-INDUCED X-RAY ANALYSIS (PIXE); STREAKER SAMPLERS; TIME OF FLIGHT (TOF); URBAN POLLUTION;

PARTICLES (PARTICULATE MATTER);

EID: 2642550714     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.02.014     Document Type: Article

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