|
Volumn 29, Issue SPEC. ISS. 1, 2004, Pages 837-855
|
Recent advances in electron optics and electron microscopy
a
a
NONE
(France)
|
Author keywords
[No Author keywords available]
|
Indexed keywords
|
EID: 26244440838
PISSN: 01824295
EISSN: None
Source Type: Journal
DOI: None Document Type: Review |
Times cited : (23)
|
References (91)
|