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Volumn 52, Issue 9, 2005, Pages 2075-2080

MOS control device concepts for AC-AC matrix converter applications: The HCD concept for high-efficiency anode-gated devices

Author keywords

Anode gated (AG); Bi directional; Insulated gate bipolar transistor (IGBT); MOS; Power semiconductor device; Reverse blocking and ac ac power convention; Thyristor

Indexed keywords

ANODES; COMPUTER SIMULATION; INSULATED GATE BIPOLAR TRANSISTORS; POWER CONVERTERS; SEMICONDUCTOR JUNCTIONS; THYRISTORS;

EID: 26244437482     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2005.854266     Document Type: Article
Times cited : (9)

References (13)
  • 1
    • 0024479168 scopus 로고
    • "Analysis and design of optimum-amplitude nine-switch direct ac-ac converters"
    • Jan
    • A. Alesina and M. G. B. Venturi, "Analysis and design of optimum-amplitude nine-switch direct ac-ac converters," IEEE Trans. Power Electronics, vol. 4, no. 1, pp. 101-112, Jan. 1989.
    • (1989) IEEE Trans. Power Electronics , vol.4 , Issue.1 , pp. 101-112
    • Alesina, A.1    Venturi, M.G.B.2
  • 2
    • 0034829334 scopus 로고    scopus 로고
    • "Characterization of a bi-directional double side double gate IGBT fabricated by wafer bonding"
    • K. D. Hobart, F. J. Kub, M. Ancona, J. M. Neilson, K. Brandmeir, and P. R. Waind, "Characterization of a bi-directional double side double gate IGBT fabricated by wafer bonding," in Proc. ISPSD, 2001, pp. 125-129.
    • (2001) Proc. ISPSD , pp. 125-129
    • Hobart, K.D.1    Kub, F.J.2    Ancona, M.3    Neilson, J.M.4    Brandmeir, K.5    Waind, P.R.6
  • 3
    • 4944236891 scopus 로고    scopus 로고
    • "1200 V reverse blocking IGBT with low loss for matrix converter"
    • T. Naito, M. Takei, M. Nemoto, T. Hayashi, and T. Ueno, "1200 V reverse blocking IGBT with low loss for matrix converter," in Proc. ISPSD, 2004, pp. 125-128.
    • (2004) Proc. ISPSD , pp. 125-128
    • Naito, T.1    Takei, M.2    Nemoto, M.3    Hayashi, T.4    Ueno, T.5
  • 4
    • 4944231382 scopus 로고    scopus 로고
    • "An ultra small isolation area for 600 V class reverse blocking IGBT with deep trench isolation process (TI-RB-IGBT)"
    • N. Tokuda, M. Kaneda, and T. Minato, "An ultra small isolation area for 600 V class reverse blocking IGBT with deep trench isolation process (TI-RB-IGBT)," in Proc. ISPSD, 2004, pp. 129-132.
    • (2004) Proc. ISPSD , pp. 129-132
    • Tokuda, N.1    Kaneda, M.2    Minato, T.3
  • 5
    • 4944251659 scopus 로고    scopus 로고
    • "1200 V class reverse blocking IGBT (RB-IGBT) for matrix converter"
    • H. Takahashi, M. Kaneda, and T. Minato, "1200 V class reverse blocking IGBT (RB-IGBT) for matrix converter," in Proc. ISPSD, 2004, pp. 121-124.
    • (2004) Proc. ISPSD , pp. 121-124
    • Takahashi, H.1    Kaneda, M.2    Minato, T.3
  • 6
    • 0042941395 scopus 로고    scopus 로고
    • "The reverse blocking igbt with ultrathin wafer technology"
    • M. Takei, T. Naito, and K. Ueno, "The reverse blocking igbt with ultrathin wafer technology," in Proc. ISPSD, 2003, pp. 156-159.
    • (2003) Proc. ISPSD , pp. 156-159
    • Takei, M.1    Naito, T.2    Ueno, K.3
  • 8
    • 0003385409 scopus 로고    scopus 로고
    • "The clustered insulated gate bipolar device: A new power semiconductor device"
    • E. M. S. Narayanan, M. Sweet, O. Spulber, M. M. De Souza, and S. C. Bose, "The clustered insulated gate bipolar device: A new power semiconductor device," in Proc. IWPSD, 1999, pp. 1307-1312.
    • (1999) Proc. IWPSD , pp. 1307-1312
    • Narayanan, E.M.S.1    Sweet, M.2    Spulber, O.3    De Souza, M.M.4    Bose, S.C.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.