Direct imaging of dopants in GaAs with cross-sectional scanning tunneling microscopy

Applied Physics Letters

Volumn 63, Issue 21, 1993, Pages 2923-2925

  Johnson, M B ^a   Albrektsen, O ^a   Feenstra, R M ^a   Salemink, H W M ^a  

^a IBM RESEARCH ZURICH   (Switzerland)

Author keywords

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Indexed keywords

EID: 26144470793     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.110274     Document Type: Article

References (8)