Electrical-resistivity model for polycrystalline films: The case of arbitrary reflection at external surfaces

Physical Review B

Volumn 1, Issue 4, 1970, Pages 1382-1389

  Mayadas, A F ^a   Shatzkes, M ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b IBM RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 25944438622     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.1.1382     Document Type: Article

References (22)

1. The mean free path of electrons in metals
2. Resistivity and Structure of Evaporated Aluminum Films
3. A formal description of SYSTEM/360
4. The Conductivity of Thin Wires in a Magnetic Field
5. The effect of grain boundaries on the electrical resistivity of polycrystalline copper and aluminium
6. Temperature dependence of the electrical resistivity of aluminium films
7. Spatial Variation of Currents and Fields Due to Localized Scatterers in Metallic Conduction