Low-voltage embedded RAMs in the nanometer era

2005 International Conference on Integrated Circuit Design and Technology, ICICDT

Volumn , Issue , 2005, Pages 235-242

  Itoh, Kiyoo ^a  

^a HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC RANDOM ACCESS STORAGE; LEAKAGE CURRENTS; SIGNAL TO NOISE RATIO; STATIC RANDOM ACCESS STORAGE;

CELL STRUCTURES; LEAKAGE-REDUCTION CIRCUITS; NANOMETER ERA; PERIPHERAL CIRCUITS;

RANDOM ACCESS STORAGE;

EID: 25844517935     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/icicdt.2005.1502639     Document Type: Conference Paper

References (19)

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